Model | CRX-60 | CRX-62 | CRX-66 |
Geometry* | 45/0 | ||
Repeatability** | dE*ab≤0.1 | dE*ab≤0.05 | dE*ab≤0.02 |
Inter-instrument agreement*** | / | / | dE*ab≤0.25 |
Display accuracy | 0.01 | ||
Measuring/Lighting calibers | Φ8mm/Φ21mm | ||
Measurement index | CIE-Lab,XYZ | Light source condition, CIE-Lab,CIE-LCh,HunterLab,CIE-Luv,XYZ,Yxy, RGB,chromatic aberration(ΔE*ab,ΔE*cmc,ΔE*94,ΔE*00),whiteness(ASTM E313-00,ASTM E313-73,CIE,ISO2470/R457,AATCC, Hunter,Taube Berger Stensby),yellowness(ASTM D1925, ASTM E313-00,ASTM E313-73),blackeness(My,dM), color fastness,color fastness,Tint(ASTM E313-00), color densityCMYK(A,T,E,M) | |
Light source condition | A,C,D65 | A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8, F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84, ID50,ID65,LED-B1,LED-B2,LED-B3,LED-B4,LED-B5, LED-BH1,LED-RGB1,LED-V1, LED-V2 | |
Lighting source | Full band balancedLED light source | ||
Field angle | 2°,10° | ||
Meet a criterion | CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 | ||
Spectroscopic method | Nanobeam splitting device | Raster | |
SenSor | Silicon optical array device | Dual-row high-precisionCMOS array sensor | |
Wavelength interval | 10nm | ||
Wavelength coverage | 400-700nm | ||
Reflectance measurement range | 0-200% | ||
Reflectance resolution | 0.01% | ||
Measurement and observation mode | Visual | ||
Calibration | Intelligent automatic calibration | ||
Accuracy guarantee | Ensure the first level of measurement | ||
Measuring time | Single measurement 110ms | Single measurement50ms | |
Measuring interval | 1s | ||
Port | USB,485,232,External trigger, analog output, Ethernet | ||
Screen | No | Full color screen,3.5 inches | |
Light source lifetime | 1 million times in 10 years | ||
Language | / | Simplified Chinese, English | |
Non-contact distance | 5mm | ||
**The whiteboard was calibrated to measure 30 standard deviations at 5-second intervals
***The average value of BCRA Series II 12 swatches was measured