CS-826 Series Professional Benchtop Spectrophotometer
Model | CS-820P | CS-821N | CS-826 |
Lighting/measuring conditions | Reflection：d/8（diffuse illumination，8°direction reception） | ||
SCI（Contains specular reflected light）/ SCE（not contain specular reflected light）measure at same time. Compliance standards：CIE No.15、GB/T 3978、GB 2893、GB/T 18833、ISO7724/1、DIN5033 Teil7、 JIS Z8722 Condition C、ASTM E1164、ASTM-D1003-07 | |||
Transmission：d/0（diffuse illumination, vertical reception） | |||
Sensor | Silicon Photodiode Array | Dual column high precision CMOS array sensor | |
Automatic calibration | - | √（Can greatly improve the long-term repeatability of the instrument） | |
Integrating sphere diameter | 152mm | ||
Wavelength range | 360nm-780nm | ||
Wavelengthinterval | 10nm | ||
Reflectance measurement range | 0-200%，resolution 0.01% | ||
Lighting source | Pulsed xenon lamps andLED | ||
Ultraviolet measurement | IncludesUV、400nmcutoff、420nmcutoff、460nmcutoff | ||
Measuring time | Single mode<2s | ||
Lighting/measuring calibers | Reflection：XLAV Φ25.4mm/Φ30mm；LAVΦ15mm/Φ18mm；MAVΦ8mm/Φ11mm；SAVΦ3mm/Φ6mm Users can customize the calibre, and the calibre switch is automatically recognized Transmission：Φ17mm/Φ25mm | ||
Transmission measurement specification | Sample height and thickness:height is not limited, thickness≤50mm | ||
Repeatability ** | ΔE*ab≤0.015，Spectral reflection/transmittance ≤0.1% | ΔE*ab≤0.01，Spectral reflection/transmittance ≤0.1% | |
Inter-Instrument Agreement** | XLAV ΔE*ab 0.25 | XLAV ΔE*ab 0.2 | |
Long-term repeatability*** | XLAV chroma value:standard deviation ΔE*ab within 0.1（under constant temperature conditions,the white correction plate is measured every hour within 24 hours) | ||
Standard observer | 2°Standard observer and 10°Standard observer | ||
Viewing light source | A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84,ID50,ID65, LED-B1,LED-B2,LED-B3,LED-B4,LED-B5,LED-BH1,LED-RGB1,LED-V1,LED-V2,LED-8 | ||
Language | Simplified Chinese,English, Traditional Chinese, Russian, Spanish, Portuguese, Japanese, Thai, Korean,German, French, Polish | ||
Display content | Spectral data,Spectrogram, chromaticity data, chromaticity Data, chromaticity map, Pass/Fail judgment, Simulation color, Color evaluation, fog, liquid chromaticity, Color bias | ||
Color space | CIE LAB,CIE LUV,LCh,Hunter Lab,Yxy,XYZ,Musell,s-RGB,βxy | ||
Chroma index | WI(ASTM E313-20,ASTM E313-73,CIE,AATCC,Hunter,Taube,Berger Stensby),YI(ASTM D1925,ASTM E313-20,ASTM E313-73), Tint(ASTM E313-20),Isochromatic index Milm,color fastness,color changing fastness,ISO brightness,R457,A density,T density,E density,M density,APHA/Hazen/ Pt-Co((platinum-cobalt index),Gardner(Gardner Index),Saybolt(SeibertIndex),Astm color,fog, total transmittance, covering power, force, intensity | ||
Color difference formula | ΔE*ab,ΔE*CH,ΔE*uv,ΔE*cmc,ΔE*94,ΔE*00,ΔEab(Hunter),555color tone classification | ||
Storage | 8GB | ||
Screen size | 7-inch capacitive touch screen | ||
Operating system | Android | ||
Power source | Dc regulated power supply | ||
Operating temperature and humidity | 5～40°C,relative humidity 80%(35°C)below no condensation | ||
Storage temperature and humidity | -20～45°C,relative humidity 80%(35°C)below no condensation | ||
Accessories | Power adapter,USB cable, transmission fixture, software U disk, black cavity, white board, green board,30mm aperture, 18mm aperture,11mm aperture,6mm aperture,support table,cuvette,damping handle | ||
Port | RS-232、USB、USB-B、Bluetooth | ||
Others | The instrument can be measured sideways,up and down (using accessories); Automatic temperatureand humidity compensation function; PC side software save sample image function | ||
※※Based on 23°C,the average value of XLAV aperture measurement of 12 swatches of BCRA Series is measured
※※※XLAV chromatic value:standard deviation ΔE*ab within 0.1（0℃-40℃ Arbitrary temperature variation）